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Rosa, A., Ricciardi, G., Baerends, E. J., & Stufkens, D. J. (1995). Density Functional Study of Ground and Excited States of MnC2(CO)C10. Inorganic Chemistry, 34, 3425-34332. https://doi.org/10.1021/ic00117a009 -
Willemse, R. J., Verhoeven, J. W., & Brouwer, A. M. (1995). Reversible charge migration in the excited state of an electron Donor-Donor-Acceptor system detected via delayed charge transfer fluorescence. Journal of Physical Chemistry, 99, 5753-5756. https://doi.org/10.1021/j100016a004 -
Wright, R. F., Roelofs, J. G. M., Bredemeier, M., Blanck, K., Boxman, A. W., Emmett, B. A., Gundersen, P., Hultberg, H., Kjonaas, O. J., Moldan, F., Tietema, A., van Breemen, N., & van Dijk, H. F. G. (1995). Nitrex-response of coniferous forest ecosystems to experimentally changed deposition of nitrogen. Forest Ecology and Management, 71, 163-169. https://doi.org/10.1016/0378-1127(94)06093-X -
Vossen, J. H., Ram, A. F. J., & Klis, F. M. (1995). Identification of SPT14/CWH6 as the yeast homologue of hPIG-A, a gene involved in the biosynthesis of GPI anchors. Biochimica et Biophysica Acta G General Subjects, 1243, 549-551. https://doi.org/10.1016/0304-4165(95)00002-S -
M. Derrick et al., M., Botje, M. A. J., Chlebana, F. S., Engelen, J. J., de Kamps, M., Kooijman, P. M., Kruse, A., Tiecke, H. G. J. M., Verkerke, W., Vreeswijk, M., Wiggers, L. W., de Wolf, E., van Woudenberg, R., & Dake, A. P. (1995). Exclusive \(\rho^{0}\) production in deep inelastic electron-proton scattering at HERA. Physics Letters B, 356, 601. https://doi.org/10.1016/0370-2693(95)00879-P -
A.J. Bakker (et al), A., Maas, R., Luijckx, G., van Amersfoort, P. W., & Litvinenko, V. N. (1995). Expected performance of FELINA, the Dutch UV-FEL in Amsterdam. Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment, 358, 358. https://doi.org/10.1016/0168-9002(94)01498-1 -
Dimian, A. C., van Diepen, D., & van der Wal, G. A. (1995). Dynamic simulation of a PVC suspension reactor. Computers & chemical engineering, 19, S427-S432. https://doi.org/10.1016/0098-1354(95)00053-5
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