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    Ye, L., Savi, A. O., & Hofman, A. D. (2025). Assessing Reliability in AI-Powered Learning Systems with A/A Tests. In L@S '25: Proceedings of the Twelfth ACM Conference on Learning @ Scale : July 21-23, 2025, Palermo, Italy (pp. 13-23). Association for Computing Machinery. https://doi.org/10.1145/3698205.3729553
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