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Results: 229
Number of items: 229
  • Tan, E. S., Imbos, TJ., Does, R. J. M. M., & Theunissen, M. (1995). An optimal unbiased classification rule for mastery testing based onlongitudinal data. Educational and Psychological Measurement, 55, 595-612. https://doi.org/10.1177/0013164495055004007
  • Does, R. J. M. M., van Dooremalen, J. A., & Stam, R. (1995). Statistical Process Control: the ASM Lithography approach. ASM Lithography.
  • Does, R. J. M. M., van Dooremalen, J. A., & Stam, R. (1995). Statistische procesbeheersing: de ASM Lithography benadering. ASM Lithography.
  • Tan, E. S., Ambergen, A. W., Willems, N., Does, R. J. M. M., & Imbos, TJ. (1995). Approximations of the normal ogive {ICC} and large sample efficiency of closed form parameters. (Technical Report). Department of Methodology and Statistics, Univ. of Limburg.
  • Roes, C. B. (1995). Shewhart-type Charts in Statistical Process Control. [Thesis, externally prepared, Universiteit van Amsterdam].
  • Banens, P. J. A., Does, R. J. M. M., van Dongen, G. B. W., Engel, J., Hasselaar, M. M. A., Lieshout, R. A. J. M., Praagman, J., Schriever, B. F., Trip, A., & van der Veen, H. (1994). Industriele statistiek en kwaliteit. Kluwer Bedrijfswetenschappen.
  • Does, R. J. M. M., van Oord, M. L., & Trip, A. (1994). Een succesvolle implementatie van statistische procesbeheersing (SPC). Sigma, 94(6), 10-13.
  • Tan, E. S. (1994). A stochastic growth model for the longitudinal measurement of ability. [Thesis, fully internal, Universiteit van Amsterdam].
  • Open Access
    Tan, E. S., Imbos, TJ., & Does, R. J. M. M. (1994). A distribution free approach for comparing growth of knowledge. Journal of Educational Measurement, 51, 51-65.
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