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    de Wit, J. G., Sieverts, E. G., & Ammerlaan, C. A. J. (1976). Divacancy in silicon: Hyperfine interactions from electron-nuclear double resonance measurements. Physical Review. B, Condensed Matter, 14(8), 3494-3503. https://doi.org/10.1103/PhysRevB.14.3494
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