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    Sieverts, E. G., Ammerlaan, C. A. J., & Muller, S. H. (1978). Divacancy in silicon: Hyperfine interactions from electron-nuclear double-resonance measurements. 2. Physical Review. B, Condensed Matter, 18(12), 6834-6848. https://doi.org/10.1103/PhysRevB.18.6834
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