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Results: 248
Number of items: 248
  • Open Access
    Tsimperidis, I., Gregorkiewicz, T., Bekman, H. H. P. T., & Langerak, C. J. G. M. (1998). Direct observation of the two-stage excitation mechanism of Er in Si. Physical Review Letters, 81, 4748. https://doi.org/10.1103/PhysRevLett.81.4748
  • Bercu, M., Zevenbergen, I. S., Gregorkiewicz, T., Ammerlaan, C. A. J., Tate, T., & Ivanov, E. (1997). Annealing behavior of crystalline silicon heavily implanted with oxygen at low temperature. In C. A. J. Ammerlaan, & B. Pajot (Eds.), Shallow-Level Centers in Semiconductors (pp. 405-410). World Scientific.
  • Pritchard, R. E., Ashwin, M. J., Tucker, J. H., Newman, R. C., Lightowlers, E. C., Gregorkiewicz, T., Zevenbergen, I. S., Ammerlaan, C. A. J., Falster, R., & Binns, M. J. (1997). Shallow thermal donors associated with H, Al and N in annealed Czochralski silicon distinguished by infrared spectroscopy. Semiconductor Science and Technology, 12, 1404-1408. https://doi.org/10.1088/0268-1242/12/11/012
  • Dirksen, R. J., Berg Rasmussen, F., Gregorkiewicz, T., & Ammerlaan, C. A. J. (1997). High-field spectroscopy of thermal donors in silicon. Materials Science Forum, 258-263, 373-378.
  • Newman, R. C., Ashwin, M. J., Pritchard, R. E., Tucker, J. H., Lightowlers, E. C., Gregorkiewicz, T., Zevenbergen, I. S., Ammerlaan, C. A. J., Falster, R., & Binns, M. J. (1997). Shallow thermal donors in annealed CZ silicon and links to the NL10 spectrum: the relevance of H, Al and N impurities. Materials Science Forum, 258-263, 379-384.
  • Open Access
    Hai, P. N., Gregorkiewicz, T., Ammerlaan, C. A. J., & Don, D. T. (1997). Copper-related defects in silicon: electron-paramagnetic-resonance identification. Physical Review. B, Condensed Matter, 56, 4620-4625. https://doi.org/10.1103/PhysRevB.56.4620
  • Hai, P. N. (1997). Deep-level defects in silicon studied by DLTS and EPR spectroscopy. [Thesis, fully internal, Universiteit van Amsterdam]. UvA.
  • Tsimperidis, I., Gregorkiewicz, T., Bekman, H. H. P. T., Langerak, C. J. G. M., & Ammerlaan, C. A. J. (1997). Photoluminescence study of erbium in silicon with a free electron laser. Materials Science Forum, 258-263, 1497-1502.
  • Kaczor, P., Dobaczewski, L., Gregorkiewicz, T., & Ammerlaan, C. A. J. (1997). Formation kinetics of the Al-related shallow thermal donors: a probe for oxygen diffusion in silicon. Materials Science Forum, 258-263, 1761-1766.
  • Hai, P. N., Gregorkiewicz, T., Ammerlaan, C. A. J., & Don, D. T. (1997). Isolated substitutional silver and silver-induced defects in silicon: an electron paramagnetic resonance investigation. Materials Science Forum, 258-263, 491-496.
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