Search results

  • Full text

  • Document type

  • Publication year

  • Organisation

Results: 58,375
Number of items: 58,375
  • Song, J.-H., van de Groep, J., Kim, S. J., & Brongersma, M. L. (2021). Non-local metasurfaces for spectrally decoupled wavefront manipulation and eye tracking. Nature Nanotechnology, 16(11), 1224-1230. https://doi.org/10.1038/s41565-021-00967-4
  • Parrenin, A., Liefferink, R. W., & Bonn, D. (2021). Dry ice hoverboard: Friction reduction by the Leidenfrost effect. Physical Review E, 103(2), Article 023002. https://doi.org/10.1103/PhysRevE.103.023002
  • Wang, J., Yang, J., Opitz, A. K., Bowman, W., Bliem, R., Dimitrakopoulos, G., Nenning, A., Waluyo, I., Hunt, A., Gallet, J.-J., & Yildiz, B. (2021). Tuning point defects by elastic strain modulates nanoparticle exsolution on perovskite oxides. Chemistry of Materials, 33(13), 5021-5034. https://doi.org/10.1021/acs.chemmater.1c00821
  • Aarts, M., van Vliet, S., Bliem, R., & Alarcon-Llado, E. (2021). Investigation of copper nanoscale electro-crystallization under directed and non-directed electrodeposition from dilute electrolytes. CrystEngComm, 23(20), 3648-3653. https://doi.org/10.1039/d1ce00143d
  • Hulva, J., Meier, M., Bliem, R., Jakub, Z., Kraushofer, F., Schmid, M., Diebold, U., Franchini, C., & Parkinson, G. S. (2021). Unraveling CO adsorption on model single-atom catalysts. Science, 371(6527), 375-379. https://doi.org/10.1126/science.abe5757
  • Valencia, F., Polian, I., & Regazzoni, F. (2021). Extending Circuit Design Flow for Early Assessment of Fault Attack Vulnerabilities. In F. Leporati, S. Vitabile, & A. Skavhaug (Eds.), 2021 24th Euromicro Conference on Digital System Design: DSD 2021 : proceedings : virtual conference, 1-3 September 2021 (pp. 385-388). IEEE Computer Society, Conference Publishing Services. https://doi.org/10.1109/DSD53832.2021.00065
  • Bellizia, D., El Mrabet, N., Fournaris, A. P., Pontié, S., Regazzoni, F., Standaert, F.-X., Tasso, É., & Valea, E. (2021). Post-Quantum Cryptography: Challenges and Opportunities for Robust and Secure HW Design. In L. Dilillo, L. Cassano, & A. Papadimitriou (Eds.), 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems: Athens, Greece (on-line virtual event), October 6-8, 2021 : DFT IEEE. https://doi.org/10.1109/DFT52944.2021.9568301
  • Abella, J., Alcaide, S., Anders, J., Bas, F., Becker, S., De Mulder, E., Elhamawy, N., Gürkaynak, F. K., Handschuh, H., Hernandez, C., Hutter, M., Kosmidis, L., Polian, I., Sauer, M., Wagner, S., & Regazzoni, F. (2021). Security, Reliability and Test Aspects of the RISC-V Ecosystem. In Proceedings, 2021 IEEE European Test Symposium (ETS): ETS 2021 : May 24-28, 2021, Belgium (pp. 205-214). IEEE. https://doi.org/10.1109/ETS50041.2021.9465449
  • Cammarota, R., & Regazzoni, F. (2021). Guest Editors’ Introduction: Special Issue on Top Picks in Hardware and Embedded Security. IEEE Design & Test, 38(3), 5-6. https://doi.org/10.1109/MDAT.2021.3068938
  • Glamočanin, O., Mahmoud, D. G., Regazzoni, F., & Stojilović, M. (2021). Shared FPGAs and the Holy Grail: Protections against Side-Channel and Fault Attacks. In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE 2021): virtual conference 1-5 February 2021 (pp. 1645-1650). (Proceedings, Design, Automation and Test in Europe). IEEE. https://doi.org/10.23919/DATE51398.2021.9473947
Page 982 of 5838