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Results: 57,892
Number of items: 57,892
  • Santoso, J., van Albada, G. D., Sloot, P. M. A., & Nazief, B. A. A. (2000). Simulation of HiĆ«rarchical Resource Management for Meta-computing Systems. International Journal of Foundations of Computer Science, 12(5), 629-643.
  • Palazzi, E., Masetti, N., Pian, E., Frontera, F., Castro-Tirado, A. J., Hjorth, J., Vreeswijk, P. M., van den Heuvel, E. P. J., Greiner, J., Francois, P., Brewer, J., Hainaut, O. R., & Piro, L. (2000). GRB000528, optical observations at ESO. GRB Coordinates Network, Circular Service, 691.
  • Fokkink, W. J., & Luttik, B. (2000). An omega-complete Equational Specification of Interleaving. (Report SEN; No. R0012). CWI.
  • Groote, J. F., Ponse, A., & Usenko, Y. S. (2000). Linearization in parallel pCRL. (Report SEN; No. Roo19). CWI.
  • Bergstra, J. A., Bethke, I., & Ponse, A. (2000). Basic Multi-Competence Programming. (Report P0001). Informatics Institute.
  • Bergstra, J. A., Bethke, I., & Loots, M. E. (2000). A First Course on C Program Reading. (Report P0002). Informatics Institute.
  • Baeten, J. C. M., & Bergstra, J. A. (2000). Mode Transfer in Process Algebra. (Report CSR; No. 00-01). TU Eindhoven.
  • Iskra, K. A., Hendrikse, Z. W., van Albada, G. D., Overeinder, B. J., & Sloot, P. M. A. (2000). Performance Measurements on Dynamite/DPVM. In J. Dongarra, P. Kacsuk, & N. Podhorszki (Eds.), Recent Advances in PVM and MPI - 7th European PVM/MPI User's Group Meeting, in series LNCS volume 1908 (pp. 27-38). Springer Verlag.
  • van den Boomgaard, R., & Heijmans, H. J. A. M. (2000). Morphological scale-space operators: An algebraic framework. In J. Goutsias, & L. Vincent (Eds.), Proceedings of the International Symposium on Mathematical Morphology and its Applications to Image and Signal Processing (pp. 283-290). Kluwer.
  • Geusebroek, J. M., Koelma, D. C., Smeulders, A. W. M., & Gevers, T. (2000). Image retrieval and segmentation based on color invariants. In IEEE Conference on Computer Vision and Pattern Recognition volume 2 (pp. 784-785). IEEE Press.
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