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Schins, J. M., Schrama, T., Squier, J., Brakenhoff, G. J., & Müller, M. (2002). Determination of material properties by use of third-harmonic generation microscopy. Journal of the Optical Society of America B - Optical Physics, 19, 1627-1634. https://doi.org/10.1364/JOSAB.19.001627
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