Some Aspects of Pseudo Random Binary Array-Based Surface Characterization

Authors
Publication date 2000
Journal IEEE Transactions on Instrumentation and Measurement
Volume | Issue number 49 | 6
Pages (from-to) 1331-1336
Number of pages 6
Organisations
  • Faculty of Science (FNWI) - Informatics Institute (IVI)
Document type Article
Published at https://doi.org/10.1109/19.893279
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