Colloidal monolayer trapped near a charged wall: A synchrotron x-ray diffraction study

Authors
  • D.K. Satapathy
  • O. Bunk
  • K. Jefimovs
  • K. Nygård
  • H. Guo
  • A. Diaz
  • E. Perret
  • F. Pfeiffer
  • C. David
  • G.H. Wegdam
  • J.F. van der Veen
Publication date 2008
Journal Physical Review Letters
Volume | Issue number 101 | 13
Pages (from-to) 136103
Number of pages 4
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Abstract Using x-ray diffraction from microfluidic channel arrays, we have determined concentration profiles of charge-stabilized silica colloids (radius 60±2 nm) confined between two like-charged dielectric walls at a few hundred nanometer distance. In solutions of very low ionic strength, strongly repulsive Coulomb interactions drive the colloids toward the central region between the walls. The addition of a small quantity of salt ions (0.2 mM) causes a dense colloidal monolayer to be trapped near the walls.
Document type Article
Published at https://doi.org/10.1103/PhysRevLett.101.136103
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