Security, Reliability and Test Aspects of the RISC-V Ecosystem

Authors
  • J. Abella
  • S. Alcaide
  • J. Anders
  • F. Bas
  • S. Becker
  • E. De Mulder
  • N. Elhamawy
  • F.K. Gürkaynak
  • H. Handschuh
  • C. Hernandez
  • M. Hutter
  • L. Kosmidis
  • I. Polian
  • M. Sauer
  • S. Wagner
  • F. Regazzoni
Publication date 2021
Book title Proceedings, 2021 IEEE European Test Symposium (ETS)
Book subtitle ETS 2021 : May 24-28, 2021, Belgium
ISBN
  • 9781665448192
ISBN (electronic)
  • 9781665418492
  • 9781665418485
Event 2021 IEEE European Test Symposium
Pages (from-to) 205-214
Number of pages 10
Publisher Piscataway, NJ: IEEE
Organisations
  • Faculty of Science (FNWI) - Informatics Institute (IVI)
Abstract
RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISC-V ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISC-V, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.
Document type Conference contribution
Language English
Published at https://doi.org/10.1109/ETS50041.2021.9465449
Other links https://www.proceedings.com/59455.html
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