TEM analysis of planar defects induced by Ti doping in Bi-2212 single crystals

Authors
  • P.H. Kes
  • A.A. Menovsky
  • N.T. Hien
  • J.J.M. Franse
Publication date 1997
Journal Physica C
Volume | Issue number 290
Pages (from-to) 239-251
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Document type Article
Published at https://doi.org/10.1016/S0921-4534(97)01634-1
Permalink to this page
Back