Postpandemic Conferences: The DATE 2023 Experience
| Authors |
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|---|---|
| Publication date | 10-2023 |
| Journal | IEEE Design & Test |
| Volume | Issue number | 40 | 5 |
| Pages (from-to) | 104-112 |
| Organisations |
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| Abstract | Date is a leading international event providing unique networking opportunities. The conference brings together designers and design automation users, researchers, and vendors, as well as specialists in hardware and software design, testing, and manufacturing of electronic circuits and systems—from system-level hardware and software implementation down to integrated circuit design. |
| Document type | Article |
| Note | Conference report |
| Language | English |
| Published at | https://doi.org/10.1109/MDAT.2023.3287930 |
| Downloads |
Postpandemic Conferences
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