Combined scanning probe microscopy and x-ray scattering instrument for in situ catalysis investigations

Authors
  • W.G. Onderwaater
  • P.C. Van Der Tuijn
  • R.V. Mom
  • M.A. Van Spronsen
  • S.B. Roobol
  • A. Saedi
  • J. Drnec
  • H. Isern
  • F. Carla
  • T. Dufrane
  • R. Koehler
  • B. Crama
  • I.M.N. Groot
  • R. Felici
  • J.W.M. Frenken
Publication date 11-2016
Journal Review of Scientific Instruments
Article number 113705
Volume | Issue number 87 | 11
Number of pages 8
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Abstract

We have developed a new instrument combining a scanning probe microscope (SPM) and an X-ray scattering platform for ambient-pressure catalysis studies. The two instruments are integrated with a flow reactor and an ultra-high vacuum system that can be mounted easily on the diffractometer at a synchrotron end station. This makes it possible to perform SPM and X-ray scattering experiments in the same instrument under identical conditions that are relevant for catalysis.
Document type Article
Language English
Published at https://doi.org/10.1063/1.4968804
Other links https://www.scopus.com/pages/publications/84999750806
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