Investigation of optical gain in Eu-doped GaN thin film grown by OMVPE method
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| Publication date | 06-2016 |
| Journal | Journal of Science: Advanced Materials and Devices |
| Volume | Issue number | 1 | 2 |
| Pages (from-to) | 220-223 |
| Number of pages | 4 |
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| Abstract |
We prepare and optically characterize a thin film of GaN:Eu. Room temperature intense emission band at around 620 nm is observed, corresponding to 5D0 → 7F2 electronic dipole transition of Eu3+ ions in the GaN host material. At lower temperatures, three components, at 621, 622, and 623 nm, arising from different Eu3+ optical centers, can be distinguished. Using a combination of variable stripe length (VSL) and shifting excitation spot (SES) methods we investigate optical gain of this Eu-related PL band at room temperature and determine its lower limit to be approximately 14 cm−1.
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| Document type | Article |
| Note | In: Special Issue in Memory of Dr. P.E. Brommer |
| Language | English |
| Published at | https://doi.org/10.1016/j.jsamd.2016.06.004 |
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Investigation of optical gain in Eu
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