Trapping of molecular hydrogen in porous silicon and at Si/SiO2 interfaces and a possible reinterpretation of the Pb center

Authors
Publication date 1994
Host editors
  • onb. onb.
Book title Diagnostic Techniques for Semiconductor Materials Processing
Pages (from-to) 385-390
Publisher Pittsburgh: Materials Research Society
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Document type Chapter
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