Edgeless planar semiconductor sensors for a Medipix3-based radiography detector
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| Publication date | 11-2011 |
| Journal | Journal of Instrumentation |
| Article number | C11019 |
| Volume | Issue number | 6 | 11 |
| Number of pages | 6 |
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| Abstract |
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size. |
| Document type | Article |
| Language | English |
| Published at | https://doi.org/10.1088/1748-0221/6/11/C11019 |
| Other links | https://www.scopus.com/pages/publications/82955201748 |
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