Deep-level defects in silicon studied by DLTS and EPR spectroscopy

Authors
  • P.N. Hai
Supervisors
Award date 20-05-1997
Publisher UvA
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Document type PhD thesis
Note Research conducted at: UvA, Van der Waals-Zeeman Laboratorium
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