- Author
- Year
- 1998
- Title
- High accuracy tracking of 2D/3D curved line-structures by consecutive cross-section matching
- Journal
- Pattern Recognition Letters
- Volume | Issue number
- 19 | 1
- Pages (from-to)
- 97-111
- Document type
- Article
- Faculty
- Faculty of Science (FNWI)
- Institute
- Van 't Hoff Institute for Molecular Sciences (HIMS)
- Abstract
- Curved 3D line-structures are found in domains such as angiography, cell biology and material science. This paper describes a new algorithm to track the line-structures with high subvoxel precision. Extra parameters determined for each cross-section are: local intensity, size, orientation and match error.
- URL
- go to publisher's site
- Language
- Undefined/Unknown
- Permalink
- http://hdl.handle.net/11245/1.424419
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