"Optical investigation of the temperature and order parameter dependences of interfacial roughening in a random field system,"

Authors
  • H.P. Schriemer
  • C.H. Choo
  • R. Taylor
Publication date 1999
Journal Physical Review B
Volume | Issue number 59
Pages (from-to) 8351-8354
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Document type Article
Published at https://doi.org/10.1103/PhysRevB.59.8351
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