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journal id: "physicalxreviewxletters"
| Authors | D.K. Satapathy, O. Bunk, K. Jefimovs, K. Nygård, H. Guo, A. Diaz, E. Perret, F. Pfeiffer, C. David, G.H. Wegdam, J.F. van der Veen | | Title | Colloidal monolayer trapped near a charged wall: A synchrotron x-ray diffraction study |
| Journal | Physical Review Letters |
| Volume | 101 |
| Year | 2008 |
| Issue | 13 |
| Pages | 136103- |
| ISSN | 00319007 |
| Faculty | Faculty of Science |
| Institute/dept. | FNWI: Van der Waals-Zeeman Institute (WZI) |
| Abstract | Using x-ray diffraction from microfluidic channel arrays, we have determined concentration profiles of charge-stabilized silica colloids (radius 60±2 nm) confined between two like-charged dielectric walls at a few hundred nanometer distance. In solutions of very low ionic strength, strongly repulsive Coulomb interactions drive the colloids toward the central region between the walls. The addition of a small quantity of salt ions (0.2 mM) causes a dense colloidal monolayer to be trapped near the walls. |
| Document type | Article |
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