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Query: journal id: "physicalxreviewxletters"

AuthorsD.K. Satapathy, O. Bunk, K. Jefimovs, K. Nygård, H. Guo, A. Diaz, E. Perret, F. Pfeiffer, C. David, G.H. Wegdam, J.F. van der Veen
TitleColloidal monolayer trapped near a charged wall: A synchrotron x-ray diffraction study
JournalPhysical Review Letters
Volume101
Year2008
Issue13
Pages136103-
ISSN00319007
FacultyFaculty of Science
Institute/dept.FNWI: Van der Waals-Zeeman Institute (WZI)
AbstractUsing x-ray diffraction from microfluidic channel arrays, we have determined concentration profiles of charge-stabilized silica colloids (radius 60±2 nm) confined between two like-charged dielectric walls at a few hundred nanometer distance. In solutions of very low ionic strength, strongly repulsive Coulomb interactions drive the colloids toward the central region between the walls. The addition of a small quantity of salt ions (0.2 mM) causes a dense colloidal monolayer to be trapped near the walls.
Document typeArticle
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